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Silicon nitride Low loss Si3 N4 · Vesna Srot · added 2008-01-21 · Beam energy and angles known · History
Analyst: Lingyang Li. Temperature: Room.
Use in HyperSpy import exspy
spectra = exspy.data.eelsdb(title="Silicon nitride", formula="Si3N4")
s = next(sp for sp in spectra if sp.original_metadata.json.id == 21676)
s.plot(plot_edges=True) Specimen Formula Si3 N4 Elements Si, N Source and purity Powder Energy range -19 – 650.5 eV Step 0.5 eV Keywords Treatment Dark current corrected Yes Gain variation corrected Yes Thickness 0.46 t/λ Acquisition Microscope VG HB501UX Gun Cold FEG Beam energy 100 kV Convergence semi-angle 10 mrad Collection semi-angle 6.5 mrad Resolution 1 eV Mode STEM Detector Parallel: Gatan ENFINA Probe size 0.5 nm² Integration time 0.005 s Readouts 10 Associated spectra Other links Please cite this spectrum If you use this spectrum, cite the contributor and the EELS Data Base.
Vesna Srot. Silicon nitride (Si3N4). EELS Data Base, spectrum 21676, 2008. https://eelsdb.eu/spectra/silicon-nitride/
Philip Ewels, Thierry Sikora, Virginie Serin, Chris P. Ewels and Luc Lajaunie. “A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu.” Microscopy and Microanalysis 22, 717–724 (2016). doi:10.1017/S1431927616000179 Copy BibTeX @misc{Srot2008eelsdb21676,
author = {Vesna Srot},
title = {Silicon nitride},
howpublished = {EELS Data Base, spectrum 21676},
year = {2008},
url = {https://eelsdb.eu/spectra/silicon-nitride/}
}
@article{ewels2016eelsdb,
author = {Ewels, Philip and Sikora, Thierry and Serin, Virginie and Ewels, Chris P. and Lajaunie, Luc},
title = {A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu},
journal = {Microscopy and Microanalysis},
volume = {22},
pages = {717--724},
year = {2016},
doi = {10.1017/S1431927616000179}
} Copy