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Silicon nitride alpha

Core loss Si3N4 (α) · Sylvie Schamm · added 2005-04-20 · Beam energy and angles known · History

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biblio cited in "Reference" for calibration purpose Dispersion not 0.19 eV/ch but 0.2 eV/ch Analyst: S.Schamm. Temperature: Room.

Use in HyperSpy
import exspy

spectra = exspy.data.eelsdb(title="Silicon nitride alpha", formula="Si3N4 (alpha)")
s = next(sp for sp in spectra if sp.original_metadata.json.id == 21586)
s.plot(plot_edges=True)

Specimen

Formula
Si3N4 (α)
Elements
Si, N
Edges
Si L2,3
Source and purity
CVD
Energy range
90.31 – 173.48 eV
Step
0.2 eV

Keywords

  • imported from old site

Treatment

Dark current corrected
No
Gain variation corrected
No
Thickness
0.4 t/λ

Acquisition

Microscope
CM30
Gun
LaB6
Beam energy
100 kV
Convergence semi-angle
8.4 mrad
Collection semi-angle
10 mrad
Resolution
1.1 eV
Mode
Diffraction
Detector
Parallel: 666 Gatan

Reference

P.E. Batson, K.L. Kavanagh, C.Y. Wong, J.M. Woodall Ultramicroscopy 22(1987) 89-102

Other links

Please cite this spectrum

If you use this spectrum, cite the contributor's paper and the EELS Data Base.

Sylvie Schamm. Silicon nitride alpha (Si3N4 (alpha)). EELS Data Base, spectrum 21586, 2005. https://eelsdb.eu/spectra/silicon-nitride-alpha-4/

P.E. Batson, K.L. Kavanagh, C.Y. Wong, J.M. Woodall Ultramicroscopy 22(1987) 89-102

Philip Ewels, Thierry Sikora, Virginie Serin, Chris P. Ewels and Luc Lajaunie. “A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu.” Microscopy and Microanalysis 22, 717–724 (2016). doi:10.1017/S1431927616000179
BibTeX
@misc{Schamm2005eelsdb21586,
  author = {Sylvie Schamm},
  title = {Silicon nitride alpha},
  howpublished = {EELS Data Base, spectrum 21586},
  year = {2005},
  url = {https://eelsdb.eu/spectra/silicon-nitride-alpha-4/}
}

@article{ewels2016eelsdb,
  author = {Ewels, Philip and Sikora, Thierry and Serin, Virginie and Ewels, Chris P. and Lajaunie, Luc},
  title = {A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu},
  journal = {Microscopy and Microanalysis},
  volume = {22},
  pages = {717--724},
  year = {2016},
  doi = {10.1017/S1431927616000179}
}
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