Analyst: M. Cheynet. Temperature: Room. BEAM/Crystal: (close to) perpendicular to [110] planes.
Use in HyperSpy
import exspy
spectra = exspy.data.eelsdb(title="Silicon", formula="Si")
s = next(sp for sp in spectra if sp.original_metadata.json.id == 21604)
s.plot(plot_edges=True)
Specimen
Formula
Si
Elements
Si
Source and purity
silicon wafer
Energy range
-7.5 – 91.9 eV
Step
0.1 eV
Keywords
imported from old site
Treatment
Dark current corrected
Yes
Gain variation corrected
Yes
Thickness
0.4 t/λ
Acquisition
Microscope
Tecnai F20
Gun
feg Schottky
Beam energy
200 kV
Convergence semi-angle
8 mrad
Collection semi-angle
1.2 mrad
Resolution
0.7 eV
Mode
STEM
Detector
Parallel: GIF
Probe size
0.3 nm²
Integration time
0.5 s
Readouts
10
Reference
Structural and chemical analysis of a model Si-SiO2 interface using spatially resolved electron energy-loss spectroscopy
M.C. Cheynet, T. Epicier
Philosophical Magazine84, 17, (2004), 1753