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directly connected to "Si-ds.XY" : after deconvolution and normalization dispersion not 0.19 eV/ch but 0.197 eV/ch Analyst: S.Schamm. Temperature: Room.
Use in HyperSpy import exspy
spectra = exspy.data.eelsdb(title="Silicon", formula="Si")
s = next(sp for sp in spectra if sp.original_metadata.json.id == 21582)
s.plot(plot_edges=True) Specimen Formula Si Elements Si Edges Si L2,3 Source and purity wafer Energy range 90.31 – 173.57 eV Step 0.197 eV Keywords Treatment Dark current corrected No Gain variation corrected No Thickness 0.4 t/λ Acquisition Microscope CM20 Gun LaB6 Beam energy 100 kV Convergence semi-angle 5.1 mrad Collection semi-angle 6.14 mrad Resolution 1.08 eV Mode Diffraction Detector Parallel: 666 Gatan Reference P.E. Batson 3M 2 (1991) 395-402
Other links Please cite this spectrum If you use this spectrum, cite the contributor's paper and the EELS Data Base.
Sylvie Schamm. Silicon (Si). EELS Data Base, spectrum 21582, 2007. https://eelsdb.eu/spectra/silicon-4/
P.E. Batson 3M 2 (1991) 395-402
Philip Ewels, Thierry Sikora, Virginie Serin, Chris P. Ewels and Luc Lajaunie. “A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu.” Microscopy and Microanalysis 22, 717–724 (2016). doi:10.1017/S1431927616000179 Copy BibTeX @misc{Schamm2007eelsdb21582,
author = {Sylvie Schamm},
title = {Silicon},
howpublished = {EELS Data Base, spectrum 21582},
year = {2007},
url = {https://eelsdb.eu/spectra/silicon-4/}
}
@article{ewels2016eelsdb,
author = {Ewels, Philip and Sikora, Thierry and Serin, Virginie and Ewels, Chris P. and Lajaunie, Luc},
title = {A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu},
journal = {Microscopy and Microanalysis},
volume = {22},
pages = {717--724},
year = {2016},
doi = {10.1017/S1431927616000179}
} Copy