← All spectra
biblio cited in "Reference" for calibration purpose Dispersion is not 0.09 eV/ch but 0.098 eV/ch Analyst: S.Schamm. Temperature: Room.
Use in HyperSpy import exspy
spectra = exspy.data.eelsdb(title="Silicon", formula="Si")
s = next(sp for sp in spectra if sp.original_metadata.json.id == 21579)
s.plot(plot_edges=True) Specimen Formula Si Elements Si Source and purity wafer Energy range -17.42 – 82.87 eV Step 0.098 eV Keywords Treatment Dark current corrected Yes Gain variation corrected Yes Thickness 0.4 t/λ Acquisition Microscope CM20 Gun LaB6 Beam energy 100 kV Convergence semi-angle 5.1 mrad Collection semi-angle 1.6 mrad Resolution 1.08 eV Mode Diffraction Detector Parallel: 666 Gatan Probe size 55 nm² Integration time 0.063 s Readouts 20 Reference P.E. Batson 3M 2 (1991) 395-402
Other links Please cite this spectrum If you use this spectrum, cite the contributor's paper and the EELS Data Base.
Sylvie Schamm. Silicon (Si). EELS Data Base, spectrum 21579, 2005. https://eelsdb.eu/spectra/silicon-2/
P.E. Batson 3M 2 (1991) 395-402
Philip Ewels, Thierry Sikora, Virginie Serin, Chris P. Ewels and Luc Lajaunie. “A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu.” Microscopy and Microanalysis 22, 717–724 (2016). doi:10.1017/S1431927616000179 Copy BibTeX @misc{Schamm2005eelsdb21579,
author = {Sylvie Schamm},
title = {Silicon},
howpublished = {EELS Data Base, spectrum 21579},
year = {2005},
url = {https://eelsdb.eu/spectra/silicon-2/}
}
@article{ewels2016eelsdb,
author = {Ewels, Philip and Sikora, Thierry and Serin, Virginie and Ewels, Chris P. and Lajaunie, Luc},
title = {A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu},
journal = {Microscopy and Microanalysis},
volume = {22},
pages = {717--724},
year = {2016},
doi = {10.1017/S1431927616000179}
} Copy