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Si Low loss Si · aneeqa · added 2016-11-25 · Beam energy and angles known · History
From spectrum image of 1800 pixels over a range of thickness
Use in HyperSpy import exspy
spectra = exspy.data.eelsdb(title="Si", formula="Si")
s = next(sp for sp in spectra if sp.original_metadata.json.id == 22049)
s.plot(plot_edges=True) Specimen Formula Si Elements Si Source and purity Si wafer Energy range -34.39 – 159.61 eV Step 0.5 eV Treatment Dark current corrected Yes Gain variation corrected Yes Calibration Low loss + drift tube Thickness 0.708 t/λ Deconvolution Fourier-ratio Acquisition Microscope Probe Corrected Jeol ARM 200F Gun Cold FEG Beam energy 200 kV Convergence semi-angle 29 mrad Collection semi-angle 36 mrad Resolution 0.5 eV Monochromated No Mode stem Detector GIF Quantum ER Integration time 0 s Readouts 1800 Please cite this spectrum If you use this spectrum, cite the contributor and the EELS Data Base.
aneeqa. Si (Si). EELS Data Base, spectrum 22049, 2016. https://eelsdb.eu/spectra/si-2/
Philip Ewels, Thierry Sikora, Virginie Serin, Chris P. Ewels and Luc Lajaunie. “A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu.” Microscopy and Microanalysis 22, 717–724 (2016). doi:10.1017/S1431927616000179 Copy BibTeX @misc{aneeqa2016eelsdb22049,
author = {aneeqa},
title = {Si},
howpublished = {EELS Data Base, spectrum 22049},
year = {2016},
url = {https://eelsdb.eu/spectra/si-2/}
}
@article{ewels2016eelsdb,
author = {Ewels, Philip and Sikora, Thierry and Serin, Virginie and Ewels, Chris P. and Lajaunie, Luc},
title = {A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu},
journal = {Microscopy and Microanalysis},
volume = {22},
pages = {717--724},
year = {2016},
doi = {10.1017/S1431927616000179}
} Copy